-Kerr Effect Measurement System 磁光克尔效应系统 |
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优势 |
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1.基于微观局部磁性分枏/span>极向和纵向克尔效?非同步量? 2.适合敏感分析m大小磁模式和磁性薄膛/span> |
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规格 |
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测量的方吐/span> |
Magneto-Optical Kerr Effect(Polar and Longitudinal Kerr Effect) |
主要功能 |
Kerr Loop Measurement |
光源 |
Diode Laser |
探测光斑 |
2-5m |
磁场 |
Max. 10kOe (1T) |
可逈/span> |
In-Plane Electromagnet |
-Kerr Effect Measurement and Magnetic Domain Observation System 克尔效应测量和磁畴观测系绞/span> |
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优势 |
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1－/span>微观测量克尔效应和磁畴观浊/span> 2.适合敏感分析m大小磁模式和磁性薄膛/span> |
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规格 |
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测量的方吐/span> |
Magneto-Optical Kerr Effect (Polar and Longitudinal Kerr Effect) |
主要功能 |
Kerr Loop Measurement and Magnetic Domain Observation |
光源 |
Diode Laser and Mercury Lamp |
探测光斑 |
2-5m |
观察分辨玆/span> |
1m (Typ.) with x50 objective lens |
磁场 |
Max. 10kOe (1T) |
可逈/span> |
Cryostat and others |
规格 |
|
测量的方吐/span> |
Magneto-Optical Kerr Effect (Polar Kerr Effect) |
主要功能 |
Kerr Loop Measurement |
光源 |
Diode Laser |
探测光斑 |
1mm (Typ.) |
磁场 |
Max. 20kOe (2T) |
Longitudinal Kerr Effect Measurement System 纵向磁光克尔效应设备 |
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规格 |
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测量的方吐/span> |
Magneto-Optical Kerr Effect (Longitudinal Kerr Effect) |
主要功能 |
Kerr Loop Measurement |
光源 |
Diode Laser |
探测光斑 |
1mm (Typ.) |
磁场 |
Max. 100 Oe (0.01T) |
Faraday Effect Measurement System 法拉第磁光克尔效应设夆/span> |
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规格 |
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测量的方吐/span> |
Faraday Effect |
主要功能 |
Faraday Measurement |
光源 |
Diode Laser |
探测光斑 |
2mm (Typ.) |
法拉第角范围: |
45 degree |
磁场 |
Max. 10kOe (1T) |
Perpendicular Magnetic Anisotropy Analysis 垂直磁各向异性分枏/span> |
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优势 |
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1.磁光克尔效应与机动旋转电磁铁磁场应用于角度依赖性分枏/span> |
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规格 |
|
测量的方吐/span> |
Magneto-Optical Kerr Effect |
主要功能 |
Kerr Loop Measurement |
光源 |
Diode Laser |
探测光斑 |
1mm (Typ.) |
磁场 |
Max. 25kOe (2.5T) |
磁场旋转范围 |
-10-100 degree |
