SIL8000 圆晶自动进样�?/span>

制造厂商：意大� Astel

The most effective system to automatically load wafers on a microscope

High speed� safe and smooth wafer handling

Automatic wafer size detection

Full set of inspection type come as standard: All wafers� programmed� random and statistical

Cassette laser mapping� wafer protrusion� cross-slot detection and critical handling conditions come as standard safety features

PC based controller� Windows 10

Touch screen interface

Designed for Leica DM8000� compatible with many semiconductor inspection microscopes like Nikon� Olympus� Zeiss

Basic bright light inspection available as option

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