认证信息
高级会员
2平/div> 称:
似空科学仪器(上海)有限公司
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证:工商信息已核宝br /> 访问量:104645
产品简今/div>
The X-Prep? fixture adapter is also secured to the motorized stage on theX-Prep? Vision? ensuring the measurement/tool control coordinates remain aligned when transferred between systems.
A library with over 130 materials (i.e. GaAs InGaAs SiC Sapphire/Al2O3 InP SiGe GaN photo-resist) is included with every system.
Meaurement & Observation - How it Works
IR light is focused onto a sample and a unique signal based on the refractive index of the material is created. The return signal is analyzed by the software to produce a thickness value.
Meauring Below 10 m Thickness
For applications requiring thinning to less than 10 m precise measurement is possible only by adding the visible light spectrometer accessory.
FEATURES
Multipoint scan or single-point thickness measurement | 10 microns to full thickness (1 mm) range of measurement (15 nm to 1 mm thick when configured with #15-51000 Spectrometer) | |
Motorized automatic X/Y/Z (auto-focus) with <1s acquisition time | Automatic edge and corner detection aligns measurement grid with X-Prep? - including theta correction | |
Edge exclusion with X/Y input | Stage fitted with X-Prep? fixture adapter | |
"Drive to Coordinate" software navigation | Viewing of either 2D plot/map or 3D graph | |
Supplied with Allied proprietary X-Correct? software | CCD camera (#15-50020) must be purchased separately if not purchasing Visible Light Spectrometer (#15-51000) | |
Roughness - 15 micron finish | 100 mm x 100 mm stage travel | |
Software automation extendable through .NET | Data export using standard Windows methods | |
One (1) year warranty | Dimensions: 14" W x 17" D x 19" H (355 x 431 x 483 mm) |
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