FT-342双电测电四探针方阻电阻率测试�?/span>

FT-342 Double electric four-probe resistance ratio tester

一.应用说明Widely used９�/span>

覆盖膛�导电高分子膜，高、低温电热膜;隔热、导电窗� 导电(屏蔽)布、装饰膜、装饰纸;金属化标签、合金类箔膜;熔炼、烧结、溅射、涂覆、涂布层，电阻式、电容式触屏薄膜;电极涂料，其他半导体材料、薄膜材料方阻测诔�/span>

硅晶块、晶片电阻率及扩散层、外延层、ITO导电箔膜、导电橡胶等材料方块电阻 半导体材�?晶圆、太阳能电池、电子元器件，导电薄膜（ITO导电膜玻璃等），金属膜，导电漆膜，蒸发铝膜，PCB铜箔膜，EMI涂层等物质的薄层电阻与电阻率 导电性油漆，导电性糊状物，导电性塑料，导电性橡胶，导电性薄膜，金属薄膜� EMI 防护材料，导电性纤维，导电性陶瓷等，提供中文或英文两种语言操作界面选择＋�/span>

covering film;Conductive polymer film. high and low temperature electric film;Insulation. anti-radiation conductive film (shielding) cloth. decorative film. decorative paper.Metallized labels and alloy foil films.Smelting. sintering. sputtering. coating. Coating layer. resistance. capacitive touch screen.Electrode coating. other semiconductor materials. thin-film material resistance testing.

Silicon block. chip resistance rate and diffusion layer. epitaxial layer. ITO conductive foil. conductive rubber materials such as square resistance .semiconductor materials/wafer. solar cells. electronic components. conductive film (ITO conductive

二．描述Description９�/span>

采用四探针组合双电测量方法，液晶显示，自动测量，自动量程，自动系数补偾�/span>.高集成电路系统、恒流输出；选配９�/span>PC软件进行数据管理和处琅�/span>.

双电测数字式四探针测试仪是运用直线或方形四探针双位测量。该仪器设计符合单晶硅物理测试方法国家标准并参考美囼�/span>A.S.T.M标准。利用电流探针、电压探针的变换，进行两次电测量，对数据进行双电测分析，解决样品几何尺寸、边界效应以及探针不等距和机械游移等因素对测量结果的影响.

�?参数资料 Parameters