机型

IRT-7200

对应FTIR主机

FT/IR-4000系列�?/span>6000系列

测光方式

逎�/span>迆�/span>?反射测量

观察方式

直接测量方式

检浊�/span>�?/span>

标准：中波段MCT检浊�/span>�?/span>选项：窄波段MCT检测器�?/span>宽波殴�/span>MCT检测器�?/span>DLATGS检浊�/span>�?/span>InSb検出器�?/span>InGaAs检测器�?/span>阵列中波段检测器MCT阵列InSb检测器�?/span>阵列InGaAs检测器

检浊�/span>器切捡�/span>

选项：配月�/span>2�?/span>检测器＇�/span>软件切换）、第2�?/span>检测器装卸配置

SN毓�/span>

1500:1(阵列MCT检测器)�?/span>8000:1(单元仵�/span>MCT检测器)

像素分解(阵列MCT)

6.25��m�?32倌�/span>)�?/span>12.5��m�?16倌�/span>)�?/span>20��m�?10倍：可逈�/span>)

测量时间(阵列MCT)

1.6科�/span>(FT/IR-6000�?/span>测量区域100��100��m、像素分觢�/span>6.25��m■�/span>、分觢�/span>400px-1�?/span>1囝�/span>计算)

观测

智能显示�?/span>（可吋�/span>时测量和观察样品（�/span>CMOS照相机：�?/span>3倍光�?/span>镜头选项：彩色液晵�/span>显示�?/span>、二眼鏡筒（内置ATOS（�/span>

观察照明

带自动照亮功胼�/span>

聚焦

标准

物鏡

标准９�/span>16倍�?/span>32倌�/span>可选择�?/span>选项９�/span>10倌�/span>

�?/span>镜镜夳�/span>

选项９�/span>10倍�?/span>20倌�/span>

対物鏡切换装�?/span>

4孔自�?/span>旊�/span>�?/span>�?/span>�?/span>�?/span>対物自動识别装置

集光鏠�/span>

16倍�?/span>32倍�?/span>10倌�/span>(选项)

集光镜自动调芁�/span>

标准功能

光圈

自動2軸独立可受�/span>、回�?/span>(单元件检测器使用旵�/span>)

样品�?/span>

标准：自�?/span>XYZ样品�?/span>�?/span>选项：控制杆

真空

选项