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上海微纳国际贸易有限公司
证:工商信息已核宝br /> 访问量:22791
证:工商信息已核宝br /> 访问量:22791
产品简今/div>
Optimal TEM specimen preparation doneFirst Time Right
Achieve ultimate specimen quality free from amorphous and implanted layers
Complements FIB technology
Milling without introduction of artifacts
Advanced detector technology for imaging and precise endpoint detection
In situ imaging with ions and electrons
Microscope connectivity for risk-free specimen handling
Adds capability and capacity
Fast reliable and easy to use
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